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纳米TiO_2-CeO_2复合薄膜的结构和光学性能
作者:赵玉涛 刘晓燕 罗志华  
单位:江苏大学材料科学与工程学院 江苏大学材料科学与工程学院 江苏大学材料科学与工程学院 江苏 镇江212013 江苏 镇江212013 江苏 镇江212013 
关键词:二氧化钛-二氧化铈复合薄膜  射频磁控溅射  微观形貌  透光率  聚对苯二甲酸乙二醇酯 
分类号:TB383.2
出版年,卷(期):页码:2008,36(2):192-197
DOI:
摘要:

采用射频磁控溅射法在柔性基体聚对苯二甲酸乙二醇酯上制备了纳米TiO_2-CeO_2复合薄膜。采用X射线衍射仪、扫描电镜和紫外-可见光谱仪研究了薄膜的物相结构、表面形貌和镀膜样品的紫外-可见光透过率及光学能隙。结果表明:沉积态的薄膜为非晶态,经150℃退火处理12h后,转化为良好的晶态,薄膜中主要含有锐钛矿结构TiO_2,未出现CeO_2的特征峰。随退火时间的延长及CeO_2含量的增加,复合薄膜表面的球形晶粒数量增多,尺寸增大,且复合薄膜的透光率增加,禁带宽度减小。特别是当CeO_2质量分数为10%,退火处理时间为12h时,晶粒尺寸为120nm,薄膜表面结晶最好;吸收边波长和截止波长均发生红移,分别从常温下的431,338 nm增加至554,351 nm,禁带宽度仅为(2.62±0.05)eV,提高了薄膜对太阳光或可见光的利用率。

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Nanometer TiO_2-CeO_2 composite films on flexible polyethylene terephthalate substrate were fabricated by radio-frequency magnetron sputtering.The phase constitution,surface morphology as well as the ultraviolet-visible(UV-VIS)transmittance and bandgap of the films were investigated by means of X-ray diffractometry,scanning electron microscopy and UV-VIS spectropho- tometry.The results show that the deposited films are amorphous,which can translate into perfect crystal phase after annealing at 150℃for 12h.The diffraction peaks of anatase phase were observed in the films,and no characteristic peaks for CeO_2 phase were ob- served.With the increase of the annealing time and CeO_2 content,the number of spherical crystal grains increases,the size becomes larger and the transparency increases,while the bandgap of the as-prepared films decreases.Particularly,when the mass fraction of CeO_2 is 10% and the annealing time is 12h,the grain size is about 120nm and the surface crystallization of the films is optimal.The absorbing edges wavelengths and cutoff wavelengths exhibite a red shift,shifting from 431 and 338 nm at normal temperature to 554 and 351 nm,respectively.The bandgap is merely(2.62±0.05)eV.Thus,the utilization ratios of the sun's rays and visible light for the films are greatly enhanced.

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基金项目:
江苏省复合材料工程技术研究中心研发项目(BM2003014);; 江苏省自然科学基金(BK2003051)资助项目。
作者简介:
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参考文献:

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