硅酸盐学报

质子激发X荧光技术在中国古玻璃成分分析中的应用

作者：李青会张斌承焕生干福熹

单位：中国科学院上海光学精密机械研究所复旦大学现代物理研究所复旦大学现代物理研究所中国科学院上海光学精密机械研究所上海 201800 上海 200433 上海 200433 上海 201800

关键词：质子激发X荧光古玻璃成分分析

分类号：K876

出版年,卷(期):页码：2003,31(10):950-954

DOI：

摘要：

化学成分分析是中国古玻璃研究中一个重要方面,可以为研究中国古玻璃的起源和技术发展等提供科学的依据,有必要发展新的测试方法。质子激发X荧光(proton induced X-ray emission,PIXE)技术是一种高灵敏度、非破坏性、多元素定量测定的分析方法。概要介绍了PIXE分析的原理、特点,相关的设备和分析过程,列举了外束PIXE技术应用于中国战国、西汉古玻璃样品分析的一些实例。PIXE分析技术在古玻璃样品特别是整形器皿的成分分析中具有广阔的应用前景。

Chemical composition analysis is one of the most important research aspects in Chinese ancient glass, as it could pro-vide scientific proof for the technical origin and development of Chinese ancient glass. It is very necessary to find out a new ana-lyzing technique. Proton induced X-ray emission (PIXE) technique is a kind of multi-element quantitative analysis method with high sensitivit'y and without detrirnent. The basie principle, performances, equipment system and process of analysis are briefly presented. Some examples for application of external-beam PIXE in chemical composition analysis of Chinese ancient glass sam-ples at warring states period and western Han dynasty are also given. There is a potential application for PIXE technique in chemical composition analysis of ancient glasses, especially for that of intact glass utensils.

基金项目：

国家自然科学基金(50272071);; 中国科学院知识创新工程

作者简介：

参考文献：

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